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晶體尺寸：~8毫米
電學(xué)性能：半導(dǎo)體，電荷密度波（CDW），Mott相
晶體結(jié)構(gòu)：六邊形
晶胞參數(shù)：a = b = 0.336 nm, c = 0.590 nm, α = β = 90°, γ = 120°
晶體類型：合成
晶體純度：＞99.995%
X-ray diffraction on a Tantalum Disulfide single crystal aligned along the (001) plane. XRD on the 1T-TaS2 was performed at room temperature using a D8 Venture Bruker. The 5 XRD peaks correspond, from left to right, to (00l) with l = 1, 2, 3, 4, 5
Powder X-ray diffraction (XRD) of a single crystal 1T-TaS2. X-ray diffraction was performed at room temperature using a D8 Venture Bruker.
Stoichiometric analysis of a single crystal 1T-TaS2 by Energy-dispersive X-ray spectroscopy (EDX).
聯(lián)系人：陳谷一
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郵箱：taizhou@sunano.com.cn
電話：021-56830191
